P and S reflection and P refraction: An integration for characterising shallow subsurface

Characterization of shallow structures was performed by using different approaches analysing both P- and S- wave seismic data with different resolution. The refraction tomography provided P and S velocity models of the first 80 m, while the reflection seismic processing gives a reasonable stacking velocity field until 300 m depth for both P- and S-wave data. So, we estimated the Vp/Vs ratio and an empirical relationship between the two velocities. We characterised the shallow layers using tomographic velocity models and the deeper layers using seismic images with different resolution. The seismic images were obtained by conventional CMP reflection seismic processing and by a novel multi-refractor imaging technique.